NIST Advanced Technology Program
Return to ATP Home Page
Meet Our Staff Meet with ATP CLSO Staff In Your Area Search for an CLSO Funded Project New Directions E-mail comments Related Links CLSO Home Page
Logo for Combinatorial Methods for Materials Research
Combinatorial Chemistry and Materials Research (CCMR)
Don Bansleben
Chemistry and Life Sciences Office
ATP Intramural and Extramural Projects Symposium:
Combinatorial Methods for Materials R&D

Friday, March 23rd, 2001
8:30 AM - 12:30 PM
Time
Presenter
Title of Project
8:30-9:00 AM John Hewes "Combinatorial Methods: From NIST to the World"
9:00-9:20 AM Don Bansleben "ATP Extramural Projects in Catalysis and Polymer Coatings"
9:20-9:40 AM Isabel Beichel "Auto Image Processing Tools for High Throughput Measurements of Polymer Coatings"
9:40-10:00AM Stephan Stranick
Peter Schenck
"Microwave-Frequency Microscopy for High Throughput Materials Analysis"
10:00-10:20 AM Marc Nyden "High-Throughput Methods for the Formulation, Characterization and Screening of Low Flammability, High Performance Polymer Blends and Nanocomposites"
10:20-10:40 AM BREAK
10:40-11:00 AM Judith E. Devaney "Genetic Programming for Automatic Algorithm Design"
11:00-11:20 AM Chris Muzny "High-Throughput Screening of Molecular Transport through Films, Membranes, and Nanostructures"
11:20-11:40 AM Edwin J. Heilweil "Advanced Mid-Infrared and THz Imaging Methods for Combinatorial Library
11:40-12:00 PM Eric Amis "Combinational Assay of Biofunctional Polymer"
12:00-12:30 PM Laurie Locascio "Micro-Reactor Elements in Plastic Micro-Channels"

Date created: March 11, 2001
Last updated:  April 12, 2005
Return to ATP Home Page ATP website comments: webmaster-atp@nist.gov   /  Technical ATP inquiries: InfoCoord.ATP@nist.gov.

NIST is an agency of the U.S. Commerce Department
Privacy policy / Security Notice / Accessibility Statement / Disclaimer / Freedom of Information Act (FOIA) /
No Fear Act Policy / NIST Information Quallity Standards / ExpectMore.gov (performance of federal programs)
Return to NIST Home Page
Return to ATP Home Page Return to NIST Home Page Go to NIST Home Page