NIST Advanced Technology Program
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Logo for Combinatorial Methods for Materials Research 2001 ATP Program Review
Combinatorial Methods for Materials Research
Friday, October 19, 2001
9:00 A.M. - 12:30 P.M.
Lecture Room D, NIST Gaithersburg
 

NOTE: All non-NIST visitors must register before 12:00 noon on October 18th for admittance onto the NIST site, indicating name, affiliation, country of origin in non-US, and expected time of arrival).

SUMMARY
The NIST Advanced Technology Program actively supports the development of new methods, standards, and commercial products using high throughput experimentation in materials science and chemistry. This program review will highlight results gained this year in the intramural and extramural projects in polymers, polymer additives, electronic materials, catalysts, membranes, and will allow for discussion time. For information, please contact Don Bansleben.
AGENDA
09:00 - 09:30 AM Introduction
Highlights of ATP Extramural Research
09:30 - 10:00 AM "High-Throughput Screening of Molecular Transport through Films, Membranes, and Nanostructures"
C. Muzny, A. Karim
10:00 - 10:30 AM "High-Throughput Methods for the Formulation, Characterization and Screening of Low Flammability, High Performance Polymer Blends and Nanocomposites"
M.R. Nyden, S. Semancik, A. Karim
10:30 - 10:45 AM BREAK
10:45 - 11:15 AM "Advanced Mid-Infrared and THz Imaging Methods for Combinatorial Library Screening"
E. Heilweil, C.A. Michaels
11:15 - 11:45 AM "Microwave-Frequency Microscopy for High Throughput Materials Analysis"
S. Stranick, S.W. Robey, D.L. Kaiser, P. Schenck, B. Am Ende, Howard K. Hung, J.E. Devaney
11:45 - 12:15 PM "Combinatorial Dewetting Patterns: From Images to Information"
A. Karim, I. Beichl
12:15 - 12:30 PM Wrap-Up Discussion: Plan Forward, Meeting Evaluation

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Date Created: October 2001
Last Update: April 12, 2005

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