FTIR Chemical Imaging Methods for Combinatorial Screening

Edwin J. Heilweil(1), Todd A. Heimer1, Larry Iwaki1, Chris A. Michaels(2), Alan Migdall1

Abstract:

There is an increasing generic need for implementing new, high-throughput experimentation methods to identify novel molecular, polymeric, as well as electrical and optical materials generated by combinatorial methods. At NIST, we are developing a rapid-analysis FTIR chemical imaging system with validation and data analysis tools for multiple US industries that would otherwise find such research technically risky. This approach combines a step-scan FTIR instrument with 256x256 pixel (InSb or HgCdTe) mid-infrared camera systems to simultaneously obtain "chemical content" images of multiple samples or combinatorial libraries. Images can be obtained at high spatial resolution (ca. 10-15 microns) using an infrared microscope or at lower resolution for large format (up to 2.5 cm) sample arrays. The general approach, data acquisition and image analysis capabilities and limitations of the instrumentation will first be discussed. Examples of spectral and spatial test patterns, polymer films, polymer bead supports and related samples will next be shown. Potential application of these methods for screening polymer blends to extract material phase diagrams as well as determining metallocene catalyst efficiencies on micro-hotplate arrays will also be presented. We envision that these methodologies will impact all measurement areas requiring rapid screening of combinatorial samples by implementing parallel detection, high-throughput processing, and advanced database storage and image analysis techniques. This work is supported in part by the NIST/ATP Intramural Program.

Biography

Dr. Edwin J. Heilweil is a research chemist in the Laser Applications Group, Optical Technology Division of the Physics Laboratory at NIST in Gaithersburg, MD. He obtained his degree in Chemical Physics with Prof. Robin Hochstrasser at the University of Pennsylvania in 1984 at which time he joined the Center for Chemical Physics as a NBS/NRC postdoctoral associate. In 1986 he became a staff member of the Molecular Spectroscopy Division, which is now part of the NIST Optical Technology Division. Dr. Heilweil was primarily involved in measuring ultrafast vibrational energy dynamics and photochemistry in liquids and for adsorbates on solids during 1984-1994. His current primary research interests include developing novel ultrafast infrared laser measurement methods, applying multiplexed infrared array detector techniques for chemical imaging and spectroscopy, and to monitor energy transfer and chemical reaction dynamics of biomolecular species using far-infrared technology (THz) in solution and on surfaces. He is a member of the American Chemical Society, Optical Society of America and Sigma Xi.

Contact information:

Edwin J. Heilweil
Optical Technology Division
Physics Laboratory, NIST
100 Bureau Drive, Stop 8441
Gaithersburg, MD 20899-8441
Phone: 301-975-2370
Fax: 301-869-5700
Email: edwin.heilweil@nist.gov

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    1. Optical Technology Division, Physics Laboratory, NIST, Gaithersburg, MD.
    2. Surface and Micro Division, Chemical Sciences and Technology Laboratory, NIST, Gaithersburg, MD

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