FTIR Chemical Imaging Methods for Combinatorial Screening
Edwin J. Heilweil(1), Todd A. Heimer1, Larry Iwaki1, Chris A. Michaels(2), Alan Migdall1
Abstract: There is an increasing generic need for implementing new, high-throughput experimentation methods to
identify novel molecular, polymeric, as well as electrical and optical materials generated by
combinatorial methods. At NIST, we are developing a rapid-analysis FTIR chemical imaging system
with validation and data analysis tools for multiple US industries that would otherwise find such research
technically risky. This approach combines a step-scan FTIR instrument with 256x256 pixel (InSb or
HgCdTe) mid-infrared camera systems to simultaneously obtain "chemical content" images of multiple
samples or combinatorial libraries. Images can be obtained at high spatial resolution (ca. 10-15
microns) using an infrared microscope or at lower resolution for large format (up to 2.5 cm) sample
arrays. The general approach, data acquisition and image analysis capabilities and limitations of the
instrumentation will first be discussed. Examples of spectral and spatial test patterns, polymer films,
polymer bead supports and related samples will next be shown. Potential application of these methods
for screening polymer blends to extract material phase diagrams as well as determining metallocene
catalyst efficiencies on micro-hotplate arrays will also be presented. We envision that these
methodologies will impact all measurement areas requiring rapid screening of combinatorial samples by
implementing parallel detection, high-throughput processing, and advanced database storage and image
analysis techniques. This work is supported in part by the NIST/ATP Intramural Program.
Biography
Dr. Edwin J. Heilweil is a research chemist in the Laser Applications Group, Optical Technology
Division of the Physics Laboratory at NIST in Gaithersburg, MD. He obtained his degree in
Chemical Physics with Prof. Robin Hochstrasser at the University of Pennsylvania in 1984 at
which time he joined the Center for Chemical Physics as a NBS/NRC postdoctoral associate. In
1986 he became a staff member of the Molecular Spectroscopy Division, which is now part of
the NIST Optical Technology Division. Dr. Heilweil was primarily involved in measuring
ultrafast vibrational energy dynamics and photochemistry in liquids and for adsorbates on solids
during 1984-1994. His current primary research interests include developing novel ultrafast
infrared laser measurement methods, applying multiplexed infrared array detector techniques for
chemical imaging and spectroscopy, and to monitor energy transfer and chemical reaction
dynamics of biomolecular species using far-infrared technology (THz) in solution and on
surfaces. He is a member of the American Chemical Society, Optical Society of America and
Sigma Xi. Contact information:
____________________
Optical Technology Division
Physics Laboratory, NIST
100 Bureau Drive, Stop 8441
Gaithersburg, MD 20899-8441
Phone: 301-975-2370
Fax: 301-869-5700
Email: edwin.heilweil@nist.gov
1. Optical Technology Division, Physics Laboratory, NIST, Gaithersburg, MD.
2. Surface and Micro Division, Chemical Sciences and Technology Laboratory, NIST, Gaithersburg, MD