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Track 4: ELECTRONICS and PHOTONICS

Microelectronics Manufacturing Infrastructure (MMI)

Photonics Manufacturing: Results, Challenges and Opportunities

Supporting Technologies for Semiconductor Lithography

Organic Electronics

Advanced Wireless Communications: Are We Ready?

Return to Program  Return to Program for 1999 ATP National Meeting

 

AGENDA:
Microelectronics Manufacturing Infrastructure (MMI)

Presentations Received as of: November 30, 1999
Monday, November 15, 1999
9:30 a.m. Welcome
Cita Furlani, Acting Director, ATP
9:35 a.m. "ATP and Microelectronics Manufacturing Update" view presentation
Michael Schen, Program Manager, ATP
  Future Challenges and Opportunities Panel Presentations and Discussion
Dr. Martin Giles, Intel Corporation
Dr. James Briguglio, DII/Multek
Dr. Srinivas Rao, Solectron Corporation
Dr. James Hutchby, Semiconductor Research Coroproation
Mr. James McElroy, National Electronics Manufacturing Initiative (NEMI)
Mr. Marshall Andrews, Interconnection Technology Research Institute (ITRI)
10:00 a.m. "Front-end Semiconductor Modeling, Simulation, Design and Manufacturing"
Dr. Martin Giles, Intel Corporation
10:45 a.m.   Coffee Break
11:00 a.m. "HDI Materials With Higher Tg" view presentation
Dr. James Griguglio, DII/Multek
11:45 a.m. Back-end TIM, Manufacturing, and Environmentally Sustainable Electronics
Dr. Srinivas Rao, Solectron Corporation
12:30 p.m.   Lunch
  Industry Perspectives and ATP Musings
2:00 p.m. Preparing a Competitive Proposal: Views from a Recent Awardee
Dr. Yun Zhang, Lucent Technologies, Electroplating Chemicals and Services
2:15 p.m. Reviewing Industry’s Proposals: What’s Needed to Succeed?
Purabi Mazumdar, ATP
2:30 p.m. Discussion/Synthesis of MMI "Sweet Spots"
3:15 p.m.   Coffee Break
  Microelectronics Manufacturing Project Briefings I:
3:30 p.m. Introductory Comments
3:35 p.m. Critical Components for Process Control in Microelectronics Manufacturing view presentation
Dr. Peter Solomon, On-Line Technologies, Inc.
3:55 p.m. Gas-cluster Ion-beam Manufacturing Tool for Next-generation Semiconductor Devices view presentation
Dr. David J. Fenner, Epion Corporation
4:15 p.m. Agent-enhanced Manufacturing System Initiative
Alan Weber, Object Space, Inc.
4:35 p.m. Integrated Control of the Semiconductor Patterning Process
Dr. Matthew Hankinson, KLA-Tencor Corporation
4:55 p.m. Closing Comments
5:00 p.m. Concludes Day 1
 
Tuesday, November 16, 1999
8:25 a.m. Day 2 Goals & Administrative Remarks
8:30 a.m. NIST Measurements R&D for Microelectronics Manufacturing
Stephen Knight, Director, NIST National Semiconductor Metrology Program
  Microelectronics Manufacturing Project Briefings II
9:00 a.m. Ultra-low Dielectric Constant Materials for Integrated Circuit Interconnects
Dr. Steve Martin, Dow Chemical Co.
9:20 a.m. Integrated GMR Isolated Devices and Planar Transformers
Dr. Ty Fayfield, Nonvolatile Electronics, Inc.   CANCELLED
9:40 a.m. Membrane Probes for Wafer, Package, and Substrate Testing
Ken Smith, Cascade Microtech, Inc.
10:00 a.m. Wafer-scale Applied Reworkable Fluxing Underfill for Direct Chip Attach
Marc Chason, Motorola, Inc.
10:20 a.m. Coffee Break / Poster Session: ATP Funded Measurements R&D for Microelectronics Manufacturing
11:20 a.m. Micro-contact Springs for High-performance Probing and Packaging
Dr. David Fork, Xerox PARC
11:40 a.m. Novel High-performance Wafer-level Reworkable Underfill Materials for Flip-chip Packaging
Dr. Quinn Tong, National Starch and Chemical Co.
12:00 p.m. Advanced Embedded Passives Technology
Dr. Goran Matijasevic, Ormet Co., Advanced Embedded Passives Technology Consortium
12:20 p.m.   Wrap Up / Action Items
12:30 p.m. Adjourn

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